Analysis of atomic force microscopy data for deformable...

Analysis of atomic force microscopy data for deformable materials

Rutland, Mark W., Tyrrell, James W.G., Attard, Phil
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Volume:
18
Language:
english
Journal:
Journal of Adhesion Science and Technology
DOI:
10.1163/1568561041581324
Date:
January, 2004
File:
PDF, 234 KB
english, 2004
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