Dependence of melting, roughness and contact resistances on Ge and Ni content in alloyed AuGe/Ni/Au-type electrical contacts to GaAs/AlGaAs multilayer structures
Abhilash, T S, Kumar, Ch Ravi, Sreedhar, B, Rajaram, GVolume:
25
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/25/3/035002
Date:
March, 2010
File:
PDF, 458 KB
english, 2010