Optoelectronic refractive index measurements: application...

IEEE Sensors Journal 2003 / 12 Vol. 3; Iss. 6

Optoelectronic refractive index measurements: application to smart processing

Cusano, A., Cutolo, A., Giordano, M., Nicolais, L.
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Volume:
3
Language:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/JSEN.2003.820319
Date:
December, 2003
File:
PDF, 442 KB
english, 2003
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