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Transmission electron microscopy assessment of the Si enhancement of TiâAlâNiâAu Ohmic contacts to undoped AlGaNâGaN heterostructures
Desmaris, Vincent, Shiu, Jin-Yu, Lu, Chung-Yu, Rorsman, Niklas, Zirath, Herbert, Chang, Edward-YiVolume:
100
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2218262
File:
PDF, 999 KB
english, 2006