Transmission electron microscopy assessment of the Si...

Transmission electron microscopy assessment of the Si enhancement of Ti∕Al∕Ni∕Au Ohmic contacts to undoped AlGaN∕GaN heterostructures

Desmaris, Vincent, Shiu, Jin-Yu, Lu, Chung-Yu, Rorsman, Niklas, Zirath, Herbert, Chang, Edward-Yi
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Volume:
100
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2218262
File:
PDF, 999 KB
english, 2006
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