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[IEEE 2012 IEEE Sensors - Taipei, Taiwan (2012.10.28-2012.10.31)] 2012 IEEE Sensors - Package stress monitor to compensate for the piezo-hall effect in CMOS Hall sensors
Huber, Samuel, Schott, Christian, Paul, OliverYear:
2012
Language:
english
DOI:
10.1109/ICSENS.2012.6411120
File:
PDF, 1.13 MB
english, 2012