“Indirect” High-Resolution Transmission Electron...

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. 4

“Indirect” High-Resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction

Kirkland, Angus I., Meyer, Rüdiger R.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927604040437
Date:
August, 2004
File:
PDF, 2.07 MB
english, 2004
Conversion to is in progress
Conversion to is failed