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[IEEE Fourteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium 1998 - San Diego, CA, USA (10-12 March 1998)] Fourteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.98CH36195) - How to extend a thermal-RC-network model (derived from experimental data) to respond to an arbitrarily fast input
Stout, R.P., Billings, D.T.Year:
1998
Language:
english
DOI:
10.1109/STHERM.1998.660381
File:
PDF, 825 KB
english, 1998