Investigation of high-frequency small-signal...

Semiconductor Science and Technology 2012 / 04 Vol. 27; Iss. 4

Investigation of high-frequency small-signal characteristics of FETs/HEMTs

Starikov, E, Shiktorov, P, Gružinskis, V
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Volume:
27
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/27/4/045008
Date:
April, 2012
File:
PDF, 691 KB
english, 2012
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