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An investigation of amorphous Ge[sub 2]Se[sub 3] structure for phase change memory devices using fluctuation electron microscopy
Jarvis, K., Carpenter, R. W., Davis, M., Campbell, K. A.Volume:
106
Year:
2009
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3225566
File:
PDF, 681 KB
english, 2009