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Reliability Evaluation of Distribution Network With DG Considering the Reliability of Protective Devices Affected by SFCL
Kim, Sung-Yul, Kim, Jin-OVolume:
21
Language:
english
Journal:
IEEE Transactions on Applied Superconductivity
DOI:
10.1109/TASC.2011.2163187
Date:
October, 2011
File:
PDF, 711 KB
english, 2011