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Barrier capacitance characteristics of CdS–Cu2S junction structures
Gaubas, E., Brytavskyi, I., Čeponis, T., Kusakovskij, J., Tamulaitis, G.Volume:
531
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2013.01.010
Date:
March, 2013
File:
PDF, 898 KB
english, 2013