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Buffer-gas assisted high irradiance femtosecond laser ionization orthogonal time-of-flight mass spectrometry for rapid depth profiling
He, Miaohong, Li, Bin, Yu, Shuyuan, Zhang, Bochao, Liu, Zhihong, Hang, Wei, Huang, BenliVolume:
28
Year:
2013
Language:
english
Journal:
Journal of Analytical Atomic Spectrometry
DOI:
10.1039/C2JA30288H
File:
PDF, 429 KB
english, 2013