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[IEEE IC's (ISPSD) - Orlando, FL, USA (2008.05.18-2008.05.22)] 2008 20th International Symposium on Power Semiconductor Devices and IC's - Time Dependent Isolation Capability of High Voltage Deep Trench Isolation
Lerner, Ralf, Eckoldt, Uwe, Schottmann, Klaus, Heinz, Steffen, Erler, Klaus, Lange, Andre, Ebest, GunterYear:
2008
Language:
english
DOI:
10.1109/ISPSD.2008.4538934
File:
PDF, 476 KB
english, 2008