[IEEE 2006 IEEE Instrumentation and Measurement Technology...

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[IEEE 2006 IEEE Instrumentation and Measurement Technology - Sorrento, Italy (2006.04.24-2006.04.27)] 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings - Low-Cost Low-Power Self-Test Design and Verification of On-Chip ADC for System-on-a-Chip Applications

Chandrasekhar, Vivek, Chen, Chien-In Henry, Yelamarthi, Kumar
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Year:
2006
Language:
english
DOI:
10.1109/IMTC.2006.328498
File:
PDF, 256 KB
english, 2006
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