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[IEEE 2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Kyoto, Japan (2010.10.6-2010.10.8)] 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems - Design and Evaluation of Burst-Mode Asynchronous 8-Bit Microprocessor Using Standard FPGA Development System
Suto, Tatsuya, Ichijo, Kenji, Yoshioka, YoshioYear:
2010
Language:
english
DOI:
10.1109/DFT.2010.28
File:
PDF, 335 KB
english, 2010