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[IEEE 2007 Korea-Japan Microwave Conference - Naha, Okinawa, Japan (2007.11.15-2007.11.16)] 2007 Korea-Japan Microwave Conference - Malfunction and Destruction Analysis of CMOS IC by Intentional High Power Microwave
Hong, Joo-Il, Hwang, Sun-Mook, Huh, Chang-Su, Huh, Uk-Youl, Choi, Jin-SooYear:
2007
Language:
english
DOI:
10.1109/KJMW.2007.4402256
File:
PDF, 2.57 MB
english, 2007