[IEEE 2008 Symposium on VLSI Technology - Honolulu, HI, USA (2008.06.17-2008.06.19)] 2008 Symposium on VLSI Technology - On the dynamic resistance and reliability of phase change memory
Rajendran, B., Lee, M-H., Breitwisch, M., Burr, G. W., Shih, Y-H., Cheek, R., Schrott, A., Chen, C-F., Lamorey, M., Joseph, E., Zhu, Y., Dasaka, R., Flaitz, P. L., Baumann, F. H., Lung, H-L., Lam, C.Year:
2008
Language:
english
DOI:
10.1109/VLSIT.2008.4588576
File:
PDF, 538 KB
english, 2008