An Application of X-ray Fluorescence Spectrometry to the...

Analytical Chemistry 1998 / 05 Vol. 70; Iss. 9

An Application of X-ray Fluorescence Spectrometry to the Study of Thin-Layer Chromatography

Ohnishi-Kameyama, Mayumi, Nagata, Tadahiro
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Volume:
70
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac9711596
Date:
May, 1998
File:
PDF, 111 KB
english, 1998
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