Temperature dependence of heavy ion-induced current...

IEEE Transactions on Nuclear Science 2002 / 06 Vol. 49; Iss. 3

Temperature dependence of heavy ion-induced current transients in Si epilayer devices

Laird, J.S., Hirao, T., Onoda, S., Mori, H., Itoh, H.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
49
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2002.1039672
Date:
June, 2002
File:
PDF, 286 KB
english, 2002
Conversion to is in progress
Conversion to is failed