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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Remote Sensing System Engineering IV - Polarization sensitivity of Visible Infrared Imager Radiometer Suite (VIIRS) Flight Unit 1
Novitsky, Edward J., Herbst, Stephen, Young, James B., Puschell, Jeffery J., Fest, Eric C., Guenther, Bruce, Ardanuy, Philip E., Puschell, Jeffery J., Bloom, Hal J.Volume:
8516
Year:
2012
Language:
english
DOI:
10.1117/12.2000151
File:
PDF, 396 KB
english, 2012