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SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Research on a multiplexed interferometry technique for absolute displacement measurement
Ma, Sen, Xie, Fang, Li, ZhaoyingVolume:
8201
Year:
2012
Language:
english
DOI:
10.1117/12.906084
File:
PDF, 200 KB
english, 2012