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Ion-sensitive field-effect transistors in standard CMOS fabricated by post processing
Jakobson, C.G., Dinnar, U., Feinsod, M., Nemirovsky, Y.Volume:
2
Language:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/JSEN.2002.802237
Date:
August, 2002
File:
PDF, 544 KB
english, 2002