Resistance and superconductivity switching caused by carrier injection: Evidences of self-trapping carriers in oxide electronics
Chen, Yuansha, Chen, Liping, Lian, Guijun, Xiong, GuangchengVolume:
106
Year:
2009
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3176491
File:
PDF, 1.38 MB
english, 2009