![](/img/cover-not-exists.png)
[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Shape-Based Image Retrieval Using a New Descriptor Based on the Radon and Wavelet Transforms
Nacereddine, Nafaa, Tabbone, Salavatore, Ziou, Djemel, Hamami, LatifaYear:
2010
Language:
english
DOI:
10.1109/ICPR.2010.492
File:
PDF, 544 KB
english, 2010