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[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - Investigation of conducted immunity and spatial distribution of RF currents for a 2-sided PCB
Rostamzadeh, CyrousYear:
2008
Language:
english
DOI:
10.1109/ISEMC.2008.4652019
File:
PDF, 510 KB
english, 2008