[IEEE Conference Record of the 2006 IEEE Industry Applications Conference Forty-First IAS Annual Meeting - Tampa, FL (2006.10.8-2006.10.8)] Conference Record of the 2006 IEEE Industry Applications Conference Forty-First IAS Annual Meeting - Power MOSFET Switching Loss Analysis: A New Insight
Shen, Z., Xiong, Yali, Cheng, Xu, Fu, Yue, Kumar, PavanVolume:
3
Year:
2006
Language:
english
DOI:
10.1109/IAS.2006.256719
File:
PDF, 340 KB
english, 2006