Application of high uniaxial strain methods for...

Physica B: Condensed Matter 2013 / 5 Vol. 417

Application of high uniaxial strain methods for semiconductor parameter determination

Kolomoets, V., Ermakov, V., Panasyuk, L., Fedosov, S., Orasgulyev, B., Nazarchuk, P.
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Volume:
417
Language:
english
Journal:
Physica B: Condensed Matter
DOI:
10.1016/j.physb.2013.02.017
Date:
May, 2013
File:
PDF, 202 KB
english, 2013
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