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[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Mosfet's hot carrier degradation characterization and modeling at a microscopic scale
Randriamihaja, Y. Mamy, Zaka, A., Huard, V., Rafik, M., Rideau, D., Roy, D., Bravaix, A.Year:
2011
Language:
english
DOI:
10.1109/IRPS.2011.5784606
File:
PDF, 351 KB
english, 2011