![](/img/cover-not-exists.png)
Position dependant critical thickness in finite epitaxial systems
Kumar, Arun, Subramaniam, AnandhVolume:
275
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2013.01.125
Date:
June, 2013
File:
PDF, 657 KB
english, 2013