Effects of thickness on the electrical properties of...

Journal of Applied Physics 2001 Vol. 90; Iss. 3

Effects of thickness on the electrical properties of metalorganic chemical vapor deposited Pb(Zr, Ti)O[sub 3] (25–100 nm) thin films on LaNiO[sub 3] buffered Si

Lin, C. H., Friddle, P. A., Ma, C. H., Daga, A., Chen, Haydn
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Volume:
90
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1383262
File:
PDF, 356 KB
english, 2001
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