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[IEEE 2006 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW'06) - New York, NY, USA (17-22 June 2006)] 2006 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW'06) - On the Use of SIFT Features for Face Authentication
Bicego, M., Lagorio, A., Grosso, E., Tistarelli, M.Year:
2006
Language:
english
DOI:
10.1109/CVPRW.2006.149
File:
PDF, 591 KB
english, 2006