using resonant inelastic x-ray scattering
Minola, M., Hozoi, L., Di Castro, D., Felici, R., Moretti Sala, M., Tebano, A., Balestrino, G., Ghiringhelli, G., van den Brink, Jeroen, Braicovich, L.Volume:
87
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.87.085124
Date:
February, 2013
File:
PDF, 729 KB
english, 2013