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Crystal structure and atomic arrangement of the metastable Ge[sub 2]Sb[sub 2]Te[sub 5] thin films deposited on SiO[sub 2]âSi substrates by sputtering method
Park, Y. J., Lee, J. Y., Youm, M. S., Kim, Y. T., Lee, H. S.Volume:
97
Year:
2005
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1877821
File:
PDF, 1.20 MB
english, 2005