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Circuit and Measurement Technique for Radiation Induced Drift in Precision Capacitance Matching
Prasad, Sudheer, Shankar, Krishnamurthy GanapathyVolume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2240013
Date:
April, 2013
File:
PDF, 1.26 MB
english, 2013