Behavioral Modeling Technique for TID Degradation of...

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IEEE Transactions on Nuclear Science 2010 / 12

Behavioral Modeling Technique for TID Degradation of Complex Analog Circuits

Jagannathan, Srikanth, Herbison, Daniel R., Holman, William Timothy, Massengill, Lloyd. W.
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Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2010.2056699
Date:
December, 2010
File:
PDF, 1.12 MB
english, 2010
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