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[IEEE 2008 International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (2008.10.12-2008.10.16)] 2008 International Conference on Advanced Semiconductor Devices and Microsystems - Study of bulk semi-insulating GaAs radiation detectors: Role of ohmic contact metallization in electrical charge transport and detection performance
Dubecky, F., Zat'ko, B., Hubik, P., Bohacek, P., Gombia, E., Chromik, S.Year:
2008
Language:
english
DOI:
10.1109/ASDAM.2008.4743341
File:
PDF, 1.03 MB
english, 2008