SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2008 - San Jose, CA (Saturday 19 January 2008)] Physics and Simulation of Optoelectronic Devices XVI - Effect of interface polarization charge on the performance of nitride semiconductor light emitting diodes
Shen, Hongen, Reed, Meredith L., Readinger, Eric D., Wraback, Michael, Osinski, Marek, Henneberger, Fritz, Edamatsu, KeiichiVolume:
6889
Year:
2008
Language:
english
DOI:
10.1117/12.773871
File:
PDF, 521 KB
english, 2008