[IEEE 2006 International Symposium on VLSI Design,...

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[IEEE 2006 International Symposium on VLSI Design, Automation and Test - Ambassador Hotel, Hsinchu (2006.4.26-2006.4.26)] 2006 International Symposium on VLSI Design, Automation and Test - Improving the Reliability of JFFS2

Chen, Chin-hsing, Huang, Wen-tzeng, Chen, Chun-ta, Hsiao, Rong-shue
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Year:
2006
Language:
english
DOI:
10.1109/VDAT.2006.258166
File:
PDF, 1.45 MB
english, 2006
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