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[IEEE 2012 IEEE 25th International SOC Conference (SOCC) - Niagara Falls, NY, USA (2012.09.12-2012.09.14)] 2012 IEEE International SOC Conference - A better-than-worst-case circuit design methodology using timing-error speculation and frequency adaptation
Londono, Sebastian Moreno, de Gyvez, Jose PinedaYear:
2012
Language:
english
DOI:
10.1109/SOCC.2012.6398370
File:
PDF, 574 KB
english, 2012