Imaging Impurities in Semiconductor Nanostructures

Chemistry of Materials 2013 / 04 Vol. 25; Iss. 8

Imaging Impurities in Semiconductor Nanostructures

Holmberg, Vincent C., Helps, Justin R., Mkhoyan, K. Andre, Norris, David J.
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Volume:
25
Language:
english
Journal:
Chemistry of Materials
DOI:
10.1021/cm400004x
Date:
April, 2013
File:
PDF, 1.43 MB
english, 2013
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