Total dose effects in conventional bipolar transistors and...

IEEE Transactions on Nuclear Science 1994 / 12 Vol. 41; Iss. 6

Total dose effects in conventional bipolar transistors and linear integrated circuits

Johnston, A.H., Swift, G.M., Rax, B.G.
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Volume:
41
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.340598
Date:
December, 1994
File:
PDF, 1.03 MB
english, 1994
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