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[IEEE 2012 International Silicon-Germanium Technology and Device Meeting (ISTDM) - Berkeley, CA, USA (2012.06.4-2012.06.6)] 2012 International Silicon-Germanium Technology and Device Meeting (ISTDM) - Terahertz Imaging Using Strained-Si MODFETs as Sensors
Meziani, Y. M., Garcia-Garcia, E., Velazquez-Perez, J. E., Coquillat, D., Dyakonova, N., Knap, W., Grigelionis, I., Fobelets, K.Year:
2012
Language:
english
DOI:
10.1109/ISTDM.2012.6222464
File:
PDF, 345 KB
english, 2012