![](/img/cover-not-exists.png)
[IEEE 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) - Kuala Lumpur, Malaysia (2012.09.19-2012.09.21)] 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) - Enhanced performance analysis of vertical strained-sigeimpact Ionization MOSFET (VESIMOS)
Saad, Ismail, Pogaku, Divya, Bakar, A R Abu, Zuhir, H. Mohd, Bolong, N., Khairul, A. M., Ghosh, Bablu, Ismail, Razali, Hashim, U.Year:
2012
Language:
english
DOI:
10.1109/SMElec.2012.6417118
File:
PDF, 897 KB
english, 2012