[IEEE 2011 IEEE 4th International Nanoelectronics Conference (INEC) - Tao-Yuan, Taiwan (2011.06.21-2011.06.24)] The 4th IEEE International NanoElectronics Conference - Deterioration of junction performance with temperature effect for 45 nm Si-capping MOSFETs on silicon substrate
Wang, Mu-Chun, Hu, You-Ming, Lin, Long-Sian, Chen, Shuang-Yuan, Liao, Wen-Shiang, Yang, Hsin-Chia, Yang, Ren-Hau, Peng, Ssu-HaoYear:
2011
Language:
english
DOI:
10.1109/INEC.2011.5991639
File:
PDF, 293 KB
english, 2011