Quantitative analysis of CuIn1−xGaxSe2 thin films with fluctuation of operational parameters using laser-induced breakdown spectroscopy
In, Jung-Hwan, Kim, Chan-Kyu, Lee, Seok-Hee, Shim, Hee-Sang, Jeong, SunghoVolume:
28
Year:
2013
Language:
english
Journal:
Journal of Analytical Atomic Spectrometry
DOI:
10.1039/C3JA30284A
File:
PDF, 2.05 MB
english, 2013