![](/img/cover-not-exists.png)
[IEEE 2011 IEEE 4th International Nanoelectronics Conference (INEC) - Tao-Yuan, Taiwan (2011.06.21-2011.06.24)] The 4th IEEE International NanoElectronics Conference - Embedded SiGe source/drain and temperature degrading junction performance on 45 nm MOSFETs
Wang, Mu-Chun, Lin, Long-Sian, Huang, Heng-Sheng, Liao, Wen-Shiang, Yang, Ren-Hau, Yang, Hsin-ChiaYear:
2011
Language:
english
DOI:
10.1109/INEC.2011.5991638
File:
PDF, 356 KB
english, 2011