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[IEEE 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Atlanta, GA, USA (2011.10.9-2011.10.11)] 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Integration of isolated RF-LDMOS transistors in a 0.25 µm SiGe:C BICMOS process
Sorge, R., Fischer, A., Schmidt, J., Wipf, C., Barth, R., Pliquett, R.Year:
2011
Language:
english
DOI:
10.1109/BCTM.2011.6082772
File:
PDF, 98 KB
english, 2011