Robust Ohmic contact junctions between metallic tips and...

Review of Scientific Instruments 2008 Vol. 79; Iss. 10

Robust Ohmic contact junctions between metallic tips and multiwalled carbon nanotubes for scanned probe microscopy

Kim, Suenne, Kim, Jeehoon, Berg, Morgann, de Lozanne, Alex
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Volume:
79
Year:
2008
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.2987696
File:
PDF, 873 KB
english, 2008
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