Reference material for transmission electron microscope calibration
Filippov, M N, Gavrilenko, V P, Kovalchuk, M V, Mityukhlyaev, V B, Ozerin, Yu V, Rakov, A V, Roddatis, V V, Todua, P A, Vasiliev, A LVolume:
22
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/22/9/094014
Date:
September, 2011
File:
PDF, 1023 KB
english, 2011