Behavioral Study of Single-Event Burnout in Power Devices...

IEEE Transactions on Electron Devices 2012 / 12 Vol. 59; Iss. 12

Behavioral Study of Single-Event Burnout in Power Devices for Natural Radiation Environment Applications

Zerarka, M., Austin, P., Toulon, G., Morancho, F., Arbess, H., Tasselli, J.
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Volume:
59
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2012.2222889
Date:
December, 2012
File:
PDF, 1.17 MB
english, 2012
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